Test Platform
Semi-Future Technology has established an IGBT chip and device testing and analysis platform, and invested more than RMB 10 million in the introduction of imported equipment and instruments in Phase I. It has been recognized as the "IGBT Public Technology Platform" in Chengdu Hi-tech Zone. The main equipment includes chip automatic sample making equipment, high magnification optical microscope, scanning electron microscope, wafer probe stage, power device curve tracer, power device dynamic tester, etc., covering a series of items testing, including chip microstructure, chip/wafer static electrical parameters, device static and dynamic parameters, and insulation voltage, and can carry out the whole processes of device failure analysis and reverse analysis.
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High magnification metallurgical microscopesupports up to 1000X super depth of field optical microscopic observation.
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Scanning electron microscopeavailable to 300,000 times magnification observation, with integrated energy spectrometer design, ap
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Wafer probe stageTaiko process-specific probe stage supports testing of 8-inch wafer products as thin as 60um.
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Power device curve tracerComprehensive characterization of dynamic parameters of IGBT devices helps to screen out dynamic def
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Power device dynamic testercomprehensive characterization of static electrical parameters of high-power devices,and the ab
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High-precision double-pulse test platformaccurate measurement of product dynamic and short-circuit parameters,which can meet the require